IFSOE 2026

Advanced Nanoscale Surface Analysis of Materials for Flexible Electronics and Sensors

Submitted: Jun 30, 2026

Abstract

In this work, we present advanced AFM-based methods for mapping local chemistry and wettability with sub-micron resolution. AFM force spectroscopy is used to probe local variations in wettability, offering insights that conventional contact angle measurements lack the sensitivity to resolve nanoscale inhomogeneities. Complementary, Nano-Vis imaging visualizes optical absorption phenomena at the nanoscale, providing spatially resolved information on local chemical composition and bandgap across the surfaces.

Keywords

AFM nanoscale analysis graphene materials surface characterization

References

  1. Murastov, G. V.; Lipovka, A. A.; Fatkullin, M. I.; Rodriguez, R. D.; Sheremet, E. S. Laser Reduction of Graphene Oxide: Tuning Local Material Properties. Phys.--Usp. 2022. https://doi.org/10.3367/ufne.2022.12.039291
  2. Lipovka, A.; Petrov, I.; Fatkullin, M.; Murastov, G.; Ivanov, A.; Villa, N.E.; Shchadenko, S.; Averkiev, A.; Chernova, A.; Gubarev, F.; Saqib, M.; Sheng, W; Chen, J.; Kanoun, O.; Amin, I.; Rodriguez, R.D.; Sheremet, E. Photoinduced flexible graphene/polymer nanocomposites: Design, formation mechanism, and properties engineering. Carbon. 2022, 194 (154-161). https://doi.org/10.1016/j.carbon.2022.03.039

Grant information

This work was supported by RSF (project № 25-23-01236).